JPH0714927Y2 - 回路基板検査装置におけるピンボード構造 - Google Patents
回路基板検査装置におけるピンボード構造Info
- Publication number
- JPH0714927Y2 JPH0714927Y2 JP14998088U JP14998088U JPH0714927Y2 JP H0714927 Y2 JPH0714927 Y2 JP H0714927Y2 JP 14998088 U JP14998088 U JP 14998088U JP 14998088 U JP14998088 U JP 14998088U JP H0714927 Y2 JPH0714927 Y2 JP H0714927Y2
- Authority
- JP
- Japan
- Prior art keywords
- test probe
- substrate
- plate
- measured
- pin board
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 238000007689 inspection Methods 0.000 title claims description 8
- 239000000758 substrate Substances 0.000 claims description 50
- 239000000523 sample Substances 0.000 claims description 44
- 230000003028 elevating effect Effects 0.000 claims description 17
- 239000000463 material Substances 0.000 claims description 15
- 238000005259 measurement Methods 0.000 claims description 8
- 230000006835 compression Effects 0.000 description 8
- 238000007906 compression Methods 0.000 description 8
- 238000005452 bending Methods 0.000 description 4
- 230000035882 stress Effects 0.000 description 4
- 238000000034 method Methods 0.000 description 3
- 238000005476 soldering Methods 0.000 description 2
- 235000004035 Cryptotaenia japonica Nutrition 0.000 description 1
- 244000146493 Cryptotaenia japonica Species 0.000 description 1
- 230000002950 deficient Effects 0.000 description 1
- 230000003993 interaction Effects 0.000 description 1
- 125000006850 spacer group Chemical group 0.000 description 1
- 230000008646 thermal stress Effects 0.000 description 1
Landscapes
- Tests Of Electronic Circuits (AREA)
- Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
- Testing Electric Properties And Detecting Electric Faults (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14998088U JPH0714927Y2 (ja) | 1988-11-17 | 1988-11-17 | 回路基板検査装置におけるピンボード構造 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP14998088U JPH0714927Y2 (ja) | 1988-11-17 | 1988-11-17 | 回路基板検査装置におけるピンボード構造 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JPH0271278U JPH0271278U (en]) | 1990-05-30 |
| JPH0714927Y2 true JPH0714927Y2 (ja) | 1995-04-10 |
Family
ID=31422706
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP14998088U Expired - Lifetime JPH0714927Y2 (ja) | 1988-11-17 | 1988-11-17 | 回路基板検査装置におけるピンボード構造 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH0714927Y2 (en]) |
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006343197A (ja) * | 2005-06-08 | 2006-12-21 | Nhk Spring Co Ltd | 検査装置 |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP7228465B2 (ja) * | 2019-05-20 | 2023-02-24 | 新光電気工業株式会社 | 半導体装置 |
-
1988
- 1988-11-17 JP JP14998088U patent/JPH0714927Y2/ja not_active Expired - Lifetime
Cited By (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2006343197A (ja) * | 2005-06-08 | 2006-12-21 | Nhk Spring Co Ltd | 検査装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| JPH0271278U (en]) | 1990-05-30 |
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